1. Smith S.T., Magnetoelastic displacement mechanisms, Report No. ME66 of the Centre For Microengineering and Metrology, University of Warwick, June 1988.
2. Chetwynd D.G. and Smith S.T., 1990, Strength degradation of ground and etched Si surfaces’, in New Materials and Their Applications, ed. by D. Holland, Inst. Phys. Conf. Ser., 111, 493-495
3. Schindel D.W., Hutchins D.A., Farahbakhsh B. and Smith S.T., 1990, High temperature, pulsed photoacoustic studies of solids, Proc. IEEE Ultra. Symp., Honolulu, Hawaii, Dec. 1990.
4. Chetwynd D.G. and Smith S.T., 1991, Super-precision slideways research, presented at the LINK Nanotechnology workshop, 25-26th Sept. 1991, Holiday Inn, Cambridge.
5. Harb S., Chetwynd D.G. and Smith S.T., 1991, Application and performance of capacitance micrometry as a super precision transfer standard, Proc. ASPE, 4, 17-20.
6. Howard L.P. and Smith S.T., 1993, The constant force profiler: A hybrid instrument for nanometric surface metrology, in International Progrees in Precision Engineering, Proceedings IPES 7, ed. Ikawa N., Shimada S., Moriwaki T., McKeown P.A. and Spragg R.C., Butterworth/Heinmann, Boston, 260-264.
7. Howard L.P. and Smith S.T., 1993, Using the constant force profiler to investigate the dynamics of mechanical contact at the stylus probe/specimen interface, Proc. ASPE, 8, 326-329
8. Xu Y. and Smith S.T., 1993, The determination of squeeze film damping in capacitance based cantilever force probes, Proc. ASPE, 8, 317-321
9. Miller J.A. and Smith S.T., 1993, Tunneling current characterisation: An application of an x-ray interferometric calibrated flexure stage, Proc. ASPE, 8, 37-40
10. Xu Y., Smith S.T. and Atherton P.D., Judge T. and Jones R., 1994, A metrological scanning force microscope, Proc. ASPE, 10, 23-28
11. Badami V.G., Smith S.T., Raja J. and Hocken R.J., 1994, Design of a three dimensional surface profiler, Proc. ASPE, 10, 230-233
12. Montiero A., Smith S. T. and Chetwynd D. G., 1995, A super precision linear slideway with angular correction in three axes, in International Progress in Precision Engineering, Proceedings IPES 8, ed. Bonis M., Alayli Y., Revel P., McKeown P.A. and Corbett J., Butterworth/Heinmann, Boston, 525-528
13. Chetwynd D.G., Liu X. and Smith S.T., 1995, Controlled force stylus displacement probe, in International Progress in Precision Engineering, Proceedings IPES 8, ed. Bonis M., Alayli Y., Revel P., McKeown P.A. and Corbett J., Butterworth/Heinmann, Boston, 17-20
14. Harb S.M., Chetwynd D.G. and Smith S.T., 1995, Tilt errors in parallel plate capacitance micrometry, in International Progress in Precision Engineering, Proceedings IPES 8, ed. Bonis M., Alayli Y., Revel P., McKeown P.A. and Corbett J., Butterworth/Heinmann, Boston, 147-150
15. Liu X., Chetwynd D.G., Smith S.T., Beriet C. and Bartlett P.N., 1995, Measurement of friction at light loads in polypyrrole thin film bearings, Proc. ASPE, 12, 368-371
16. Chen Kuo-Shen, Montiero A., Trumper D.L., Smith S.T., and Williams M.E., 1995, Spring dominated regime design of a high load capacity, electromagnetically driven X-Y- Stage, Proc. ASPE, 12, 199-202
17. Vidic M., Harb S. M. and Smith S.T., 1996, Observations of contact measurements using a resonance based touch sensor, Proc. ASPE, 14, 41-46
18. Badami V.G., Smith S.T. and Patterson S.R., 1996, A metrological three-axis translator and its application for constant force profilometry, Proc. ASPE, 14, 391-395
19. Abdel‑Aal H. A. and Smith S. T., On the area of contact between two sliding metals, Proceedings of the 13th ISPE/IEE International Conference on CAD/CAM Robotics & Factories of the Future 97, Universidad Technologica de Pereira, Colombia, South America, (1997) 86-94
20. Beckwith J., Patterson S.R., Thompson D., Badami V.G. and Smith S.T., 1997, Metrology of 13 nm optics for extreme ultraviolet lithography, NRLM.
21. Harb S.M. and Smith S.T., 1997, Surface Characterisation Using A Resonator Based Profilometer, Proc. ASPE, 15, 3-9
22. Abdel-Aal H.A. and Smith S.T., 1998, The influence of friction-induced heat on the area of contact between sliding metals, SECTAM XIX, 362-370.
23. Abdel-Aal H.A. and Smith S.T., 1998, Thermal modeling of silicon machining: Issues and challenges, Proc. ASPE, 17, 19-23
24. Woody S.C. and Smith S.T., 1998, A vector touch sensor probe, Proc. ASPE, 18, 471-474
25. Singh G. and Smith S.T., 1999, Frequency response of stylus probes, Proc. ASPE, 18, 462-466.
26. Woody S.C. and Smith S.T., 1999, A vector touch sensor probe (a status report), Proc. ASPE, 20, 538-541
27. Muralikrishnan B., Singh G., Hsu C.H., Smith S.T. and Raja J., 2000, Rapid stylus profilometer: A two dimensional profiler for cylindrical workpieces, in Precision Engineering, Narayanasamy K. and Srinivasa Y.G. (eds.), Proceedings of the first national conference on precision engineering, Narosa Publishing House, New Delhi, 403-413.
28. Smith S.T. and Dogaru T., 2000, A giant magneto resistance based eddy current probe for the measurement of small surface defects, Proc. 6th EPRI Balance-of-Plant Heat Exchanger NDE Symposium, 5 pages
29. Smith S.T. and Dogaru T., 2000, A giant magneto resistive eddy current sensor for use as a zero-width coordinate measuring machine probe(invited), Proc. ASPE, 22, 533-536
30. Woody S.C. and Smith S.T., 2000, A lathe tool translator for form error reduction in diamond turning, Proc. ASPE, 22, 256-259.
31. Dogaru T. and Smith S.T., Integrated giant magnetoresistive transducer for eddy current testing, Proc. 15th WCNDT, Rome, Oct. 2000.
32. Seugling R.M., Jacobs R.H.R, Smith S.T., 2001, Howard L.P., LeBrun T., 2001, A Six Degree of Freedom, Piezoelectrically Actuated Translation Stage, Proc. ASPE, 23, 66-70.
33. Woody S.C. and Smith S.T., 2001, Enhancing Precision Manufacturing Through In-Situ Metrology, Proc. ASPE, 23, 17-22.
34. Smith C.S., Schneider R.W., Smith S.T. and Dogaru T., Non destructive testing (NDT) utilizing spin dependent tunneling sensors, MAT2001 Conference, Nuremberg, May 2001, 205 – 210.
35. Smith S.T., Yang H. and Seugling R.M., 2001, Polymeric bearings for nanotechnology applications, Proc. ASPE, 24, 70-75.
36. Smith C.S., Schneider R.W., Smith S.T. and Dogaru T., 2001, SDT magnetic sensors for non-destructive test and other low-field applications, Proc. Sensors Expo. and Conf., (Advanstar Publications, Peterborough, NH), 417 – 427.
37. Smith C.H., Schneider R.W., Dogaru T., Smith S.T., 2002, GMR Magnetic Sensor Arrays for NDE Eddy-Current Testing, Quantitative NonDestructive Evaluation Conference, Bellingham WA, July 14-19.
38. Woody S.C. and Smith S.T., Jain P., Iida D. and Bauza M., 2003, PZN Based nano-positioning systems, Proc. ASPE, 26, 113 – 118.
39. Smith S.T. and Seugling R.M., 2003, Small volume metrology (invited), Proc. ASPE, 26, 48 – 52.
40. Smith S.T. and Seugling R.M., 2003, Design considerations for future small machines, Proc. 3rd COPEN, Banglore December 19 – 20th, ISBN 81-7319-590-0, 20 – 26.
41. Smith C.H., Schneider R.W., Dogaru T. and Smith S.T., 2004, Height control for eddy-current detection of flaws under surface coatings, NSF DMII annual conference (Dallas, Tx), 7 pages.
42. Yang H., Seugling R.M., Jain P., Peruru H., Smith S.T., Hocken R.J, Otten D., Trumper D.L., 2004, Towards a coarse/fine approach to multi-degree-of-freedom ultra-precision motion control systems: Current status, NSF DMII annual conference (Dallas, Tx), 5 pages
43. Yang H., Seugling R.M., Jain P., Peruru H, Smith S.T., Hocken R.J., David Otten and David L. Trumper, 2004, Towards a coarse/fine approach to multi-degree-of-freedom ultra-precision motion control systems, Proc. ASPE., 32, 9 – 14.
44. Yang H., Seugling R.M., Buice E., Smith S.T., Hocken R.J., 2004, Thin film UHMWPE for precision bearings, Proc. Euspen, 4, 181 – 182.
45. Woody S.C., Jain P., Bauza M., Hocken R.J. and Smith S.T., 2004, Characterization of a scanning microscopy tuning fork and optical fiber assembly with an application to biotechnology, Proc. Euspen, 4, 392 – 393.
46. Bauza M., Woody S.C., Jain P., Smith S.T., Hocken R.J., 2004, Probing System for Rapid Measurement in Manufacturing Environments, Proc. Euspen, 4, 244 – 245.
47. Yang H., Seugling R.M., Jain P., Fagan T., Smith S.T., Hocken R.J., David Otten and David L. Trumper, 2004, A coarse/fine motion control stage; preliminary studies, Proc. ASPE., 34, 434 – 437.
48. Smith S.T., David L. Trumper, David Otten, Hocken R.J., Yang H., Seugling R.M., 2005, Motion control platform for accurate measurement and manufacture of nanostructures, NSF DMII annual conference (Scottsdale, Az), 6 pages
49. Bauza M., Woody S.C., Jain P., Smith S.T., Hocken R.J., 2004, Design, manufacture and performance evaluation of a rapid probing machine, Proc. ASPE, 34, 28 – 31.
50. Buice E.S., Yang H., Seugling R.M., Smith S.T., Hocken R.J., 2004, Assessment of thin film UHMWPE for precision bearings, Proc. ASPE, 34, 217 – 220
51. Yang H., Buice E., Smith S.T., Hocken R.J., Fagan T, David Otten, David L. Trumper and Seugling R.M., 2005, Design and performance evaluation of a coarse/fine precision motion control system, Proc. EUSPEN. Annual meeting, Montpelier, France, 373 – 376, ISBN: 92-990035-0-5.
52. Buice E.S., Yang H., Seugling R.M., Smith S.T., Hocken R.J., David Otten and David L. Trumper, 2005, A coarse/fine motion control stage; preliminary studies, Proc. ASPE., 37,
53. Woody S.C., Bauza M., Hocken R.J. and Smith S.T., 2005, Development of High Aspect Ratio Microscale Force Probes, Proc. ASPE, 37,
54. Bernadette T. Donovan-Merkert, Angela Davies, Mahnaz El-Kouedi, Joanna K. Krueger, Jordan C. Poler, Thomas A. Schmedake, Stuart T. Smith, Ed Stokes ” Efforts to Implement a Ph.D. degree program in “Nanoscale Science” at UNC Charlotte” Materials Research Society Symposium KK, San Francisco, CA April 18th 2006
55. Bauza M.B., Woody S.C., Smith S.T. and Hocken R.J., 2006, Utraprecision microscale hole scanning metrology, Proc. ASPE
56. Elliot K.E., Smith S.T., Elliot G.D. and Moyer P.J., 2007, Combined force mapping and fluorescence microscopy system to study molecular dynamics in live cells, Proceedings of the 7th euspen International Conference – Bremen – May 2007, vol. 1, 41 – 44.
57. Nowakowski B.K., Smith S.T. and Woody S.C., 2008, Micro and nano assembly tools utilizing standing wave technology, Proc. ASPE, 44, 526 – 530.
58. Yang R.H., Teo C.S., Buice E.S., Liu X., Wang W. and Smith S.T., 2008, Control strategies for a positioning machine at nanometer level, Proc. ASPE, 44, 276 – 279.
59. Bauza M.B., Woody S.C., Smith S.T., Seugling R.M., Darnell I.M. and Florando J.N., 2008 Microscale metrology using standing wave probes, Proc. ASPE, 44, 340 – 344.
60. Seugling R.M., Darnell I.M., Florando J.N., Woody S.C., Bauza M. and Smith S.T., 2008, Investigating scaling limits of a fiber based resonant probe for metrology applications, Proc. ASPE, 44, 120 – 123.
61. Bauza M.B., Seugling R.M., Woody S.C., Nowakowski B.K., Smith S.T., Darnell I.M., Florando J.N. and Fitsos P.J., 2008, Microscale metrology and assembly using standing wave probes, Proc. ICOMM,.
62. Chakraborty N., Parker W., Elliot K.E., Smith S.T., Moyer P.J. and Elliott G.E., 2008, Molecular mobility in trehalose loaded mammalian cells: Time-resolved fluorescence anisotropy measurements, Proc. ASME Summer Bioengineering Conference, Marco Island, FL, manuscript SBC2008-193077.
63. Bauza M.B., Woody B.A., Woody S.C. and Smith S.T., 2009, 3-D surface profilometry of high aspect ratio features, 12th International conference on Metrology and Properties of Engineering Surfaces, Rzesow, Poland, July 2009.
64. Bauza M.B., Smith S.T. and Woody S.C., 2009 Development of a novel ultra-precision spindle, Proc. ASPE, (Talk), 47, 14 – 17.
65. Nowakowski B.K., Smith S.T., Morris D. and Smith D.T., 2009, Development of a metrological nanoindenter, Proc. ASPE., 47, 271-274.
66. Bauza M, Woody S.C., Smith S,T. and Woody B.A., 2010, Microscale surface and form profilometry using a standing wave probe, Metromet Conference, Bilboa, Spain, February.
67. Bauza M, Woody S.C., Seugling R.M. and Smith S,T., 2010, Dimensional measurements of ultra delicate materials using micrometrology tactile sensing, Proc. ASPE, 50, 73 – 76.
68. Yang H.R., Smith S.T., de la Maza B., 2010, Microprobe metrology study: Latest results, Proc. ASPE, 50, 77 – 80.
69. Lin F., Parker W., Smith S.T. and Moyer P.J., 2010, A fast scanner design for the multi-probe microscope, Proc. ASPE, 50, 89 – 92.
70. Hastings D.J., Graham J., Nowakowski B., Smith S.T. and Tomblin J., 2010, A three fingered hand for a micro-assembly system, Proc. ASPE, 50. 93 – 96.
71. Nowakowski B.K., Smith S.T., Morris D. and Smith D.T., 2010, Adavancements in development of an ultra-precision, SI-traceable nanoindentation platform, Proc. ASPE., 50, 97 – 100.
72. Howard S.C., Chesna J. W., Mullany B. A. and Smith S.T., 2011, Subcomponent developments for a vortex machining test facility, Proc. ASPE., 53,
73. Chesna J., Smith S.T., Hastings D.J., Borja de la Maza, Nowakowsk B.K. and Lin F., 2012, Development of a Micro-scale Assembly Facility with a Three Fingered, Self-aware Assembly Tool and Electro-chemical Etching Capabilities, Proc. 6th IPAS conference, Chamonix,
