Principle Investigator

Soumitra R. Joy

Soumitra Joy has served as a Device Engineer in Intel Corporation for 4 years, and has done research on addressing the issue of reliability of high bandgap (GaN) devices. He received his Ph.D. degree from the department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, USA, and his B.Sc. and M.Sc. degree from Bangladesh University of Engineering and Technology, Bangladesh. He served as a faculty member in the Department of Electrical Engineering in Bangladesh University of Engineering and Technology. His primary research interests are applied electromagnetics and metamaterial for VLSI, and semiconductor device reliability.