{"id":19,"date":"2011-09-13T20:16:35","date_gmt":"2011-09-14T00:16:35","guid":{"rendered":"https:\/\/coefs.charlotte.edu\/bamullan\/?page_id=19"},"modified":"2026-03-03T16:42:37","modified_gmt":"2026-03-03T21:42:37","slug":"publications","status":"publish","type":"page","link":"https:\/\/coefs.charlotte.edu\/bamullan\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"\n\n<h2 class=\"wp-block-heading\"><strong>Papers in Referred Journals<\/strong><\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li>J.&nbsp;Yan,&nbsp;B. Mullany,&nbsp;A. Beaucamp,&nbsp;D. Meyer,&nbsp;N. Sugita, &#8220;Surface finishing by shape-adaptive processes&#8221;, CIRP Annals, Volume 74, Issue 2,Pages 1019-1045.  2025.<\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">J. Redford, B. Mullany,<\/span> &#8220;Classification of Visual Smoothness Standards Using Multi-Scale Areal Texture Parameters and Low-Magnification Coherence Scanning Interferometry&#8221;, Materials, 2024, 17, 1653. <\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">J. Redford, B. Mullany, &#8220;Construction of a Multi-Class Discrimination Matrix and Systematic Selection of Areal Texture Parameters for Quantitative Surface and Defect Classification&#8221;, Journal of Manufacturing Systems, Volume 71, December, Pages 131-143, 2023.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, E. Savio, H. Haitjema, R. Leach, &#8220;The implication and evaluation of geometrical imperfections on manufactured surfaces &#8220;, Annals of the CIRP, Vol. 71 (2), pp. 717-739, 2022.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">V. R. Saranam, B. Mullany, A. Tabei, S. Srenevas, C. Evans, B. Paul, \u201cSurface topographical effects in the diffusion bonding of 316 stainless steel\u201d, Journal of Materials Processing Technology, Volume 296, October 2021.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Guo, C., Shi, Z., Mullany, B. A., Linke, B. S., Yamaguchi, H., Chaudhari, R., Hucker, S., and Shih, A, &#8220;Recent Advances in Machining with Abrasives&#8221;, ASME.&nbsp;J. Manuf. Sci. Eng, May 2020, pp. 1-36, 2020.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">F. Azimi, B. Mullany, &#8220;Geometric surface feature detection using statistical based metrics&#8221;, Precision Engineering, Vol. (60), pp. 602-609, 2019.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">H. Shahinian, B. Mullany, &#8220;Polishing spherical BK7 workpieces with fiber-based tools&#8221;, Optical Engineering, Vol. 58, No. 9, 2019.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">H. Shahinian, M. Hassan, H. Cherukuri, B. Mullany, &#8220;Fiber-based tools: material removal and mid-spatial frequency error reduction&#8221;, Applied Optics, Vol. 56, No. 33, 2017.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, H. Shahinian, J. Navare, F. Azimi, E. Fleischhauer, P. Tkacik, R. Keanini, &#8220;The application of computational fluid dynamics to vibratory finishing processes&#8221;, Annals of the CIRP, 66\/1\/2017, 309-312, 2017.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\"> R.G. Keanini, P. Tkacik, E. Fleischhauer, H. Shahinian, J. Sholar, F. Azimi, B. Mullany, Macroscopic liquid-state molecular hydrodynamics, Scientific Reports 7, Article number: 41658, 2017.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">E. Uhlmann, B. Mullany, D. Biermann, K. P. Rajurkar , T. Hausottee, E. Brinksmeier, &#8220;Process Chains for High-Precision Components with Micro-Scale Features&#8221;, Annals of the CIRP, Vol. 65 (2), pp. 549-572, 2016.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">H. Shahinian, H. Cherukuri, B. Mullany, &#8220;An Evaluation of Fiber-Based Tools for Glass Polishing Using Experimental and Computational Approaches\u201d, Applied Optics, Vol 55, Issue 16, Pages 4307-4316, 2016. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">E. Fleischhauer , F. Azimi, P. Tkacik, R. Keanini, B. Mullany, &nbsp;\u201cApplication of Particle Image Velocimetry (PIV) to Vibrational Finishing\u201d, Journal of Materials Processing Technology, Volume 229, Pages 322-328, March, 2016.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Y. Dong, T. Hutchens, B. Mullany, E. Morse, A. Davies \u201cUsing a 3-D optical simulation to investigate uncertainty in image-based dimensional measurements\u201d,<em>Opt. Eng<\/em>. 53(9), 092007, May 07, 2014.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">S. Howard, J. Chesna, S. Smith, B. Mullany, \u201cOn the Development of an Experimental Testing Platform for the Vortex Machining Process\u201d, J. Manuf. Sci. Eng. 135(5), 2013.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Zheng, Y. Dong, B. Mullany, E. Morse, A. Davies,\u201d Positioning Sensor by Combining Photogrammetry, Optical Projection and a Virtual Camera Model\u201d, Measurement Science and Technology, Vol. 24(10), 2013.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, M. Mainuddin, W. Williams, R. Keanini, An Experimental and Analytical Investigation into the Effects of Process Vibrations on Material Removal Rates during Polishing, Journal of Applied Physics, Vol13, (22),2013.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Zheng B., Dong Y., Mullany B., Morse E., Davies A., \u201cUsing Optical Projection in Close-range Photogrammetry for 6DOF Sensor Positioning\u201d, Photogramm. Eng. Remote Sens., Vol. 79, No.1, pp79-86, 2013.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, M. Mainuddin, \u201cThe Influence of Process Vibrations on Precision Polishing Metrics\u201d, Annals of the CIRP, 61\/1\/2012, 555-558, 2012.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">W. Williams, B. Mullany, P. Moyer, W. Parker, M. Randles, Using Quantum Dots to Evaluate Subsurface Damage Depths &amp; Formation Mechanisms in Glass, Annals of the CIRP, 59\/1\/2010, 569-572, 2010. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, S. Turner,&#8221;Optical Polishing Pitches: Impact Frequency Responses and Indentation Depths&#8221;, Applied Optics, Vol. 49, No. 3, pp. 442 &#8211; 449, 2010. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Nowakowski, S.T. Smith, B.A. Mullany, S.C. Woody, &#8220;Vortex Machining: Localized Surface Modification Using an Oscillating Fiber Probe&#8221;, Machining Science and Technology, Vol. 13, No.4, pp. 561 &#8211; 570, 2009. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">W. Williams, B. Mullany, P. Moyer, W. Parker, M. Randles, Using Quantum dots to Tag Subsurface Damage in Lapped and Polished Glass Samples, Applied Optics, Vol. 48, No. 28, pp. 5155-5163, 2009. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, Monte Carlo Analysis of Machine Tool Positional Accuracy and Repeatability Standards, Transactions of NAMRI\/SME, pp. 309-316, Vol. 36, 2008. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">M. Davies, T. Ueda, R. M. Saoubi, B. Mullany, A.L. Cooke, On The Measurement of Temperature in Material Removal Processes, Annals of the CIRP, 55\/2\/2007. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">C. Evans, E. Paul, D. Dornfeld, D.A. Lucca, G. Byrne, M. Tricard, F. Klocke, O. Dambon and B.A. Mullany, Material Removal Mechanisms in Lapping and Polishing, CIRP Annals vol. 52\/2\/2003. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, The Effect of Slurry Viscosity on the Chemical Mechanical Polishing (CMP) of Silicon Wafers, Journal of Materials Processing Technology, 132, pp. 28-34, 2003. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, P. Young, The Effect of Pad Wear on the Chemical Mechanical Polishing of Silicon Wafers, CIRP Annals, vol 48\/1\/1999, pp. 143-146, (ISBN 3-905 277-31-X), 1999.<\/span><\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Reviewed Conference Proceedings<\/strong><\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li>J. Redford, J. Fox, C. Evans, B. Mullany, A. Allen, E. Morse, Center-Line-Time Functions and Critical Constants for Predicting Laser Powder Bed Fusion Melt Pool Distortion Using One Surface Topography Measurement. Proceedings of Joint Special Interest Group meeting between EUSPEN and ASPE, Advancing Precision in Additive Manufacturing, KU Leuven, Belgium, September 2023.<\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">J.C. Fox, A. Sood, R.Isaacs, P. Brackman, B. Mullany, E. Morse, A. Allen, E. Costa Santos, C. Evans, \u201cSurface Feature Characteristics of Laser Powder Bed Fusion of Nickel Super Alloy 625 Bulk Regions\u201d, Procedia CIRP, Volume 108, 2022, Pages 531-536.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">A. Sood, and B. Mullany, \u201cAdvanced Surface Analysis to Identify Media Workpiece Contact Modes in a Vibratory Finishing Processes\u201d, NAMRC 49, Cincinnati, OH, June 2021<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">G. Byrne, E. Ahearne, M. Cotterell, B. Mullany, G.E. O\u2019Donnell, F. Sammler, &#8220;High Performance Cutting (HPC) in the New Era of Digital Manufacturing &#8211; A Roadmap&#8221;, 7th HPC CIRP Conference on High Performance Cutting (HPC), Procedia CIRP 46 (2016) 1-6.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">H. Shahinian, B. Mullany, \u201cOptical Polishing using Fiber Based Tools\u201d, 3rd CIRP Conference on Surface Integrity (CSI), Charlotte, Procedia CIRP 45 (2016) 183-186.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">M. Mainuddin, R. Keanini, B. Mullany, &#8220;Utilizing Small External Vibrational Sources to Increase Polishing Material Removal Rates&#8221;, MSEC, Charlotte, NC, June 2015.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, B. Linke, M. Jackson, \u201cAbrasive Technologies: Current Research Activities and Directions \u2013 Highlights of the ASME 2014 Manufacturing Science and Engineering Conference (MSEC2014)\u201d, Optical Fabrication and Testing (OF&amp;T), Paper OTh1B.4, June, Kona, HW 2014.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">M. Mainuddin, B. Mullany, \u201cEvaluating the Effect of Single Frequency Vibrations on Pitch Polishing Outcomes\u201d, to be published in Optical Fabrication and Testing (OF&amp;T), Paper OM4D.5, June, Monterey, CA 2012.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">S. Howard, J. Chesna, B. Mullany, S.T. Smith,\u201d Observations During Vortex Machining Process Development,\u201d MSEC 2012, Notre Dame, Indiana, June 2012.<\/span><\/li>\n<\/ul>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-family: georgia,palatino;font-size: small\">M. Mainuddin, B. Mullany, &#8216;Evaluating the influence of vibrations in precision polishing&#8217;, Optifab, Rochester, NY, May 2011 <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, J. Beaman, &#8220;The response of pitch to higher frequency vibrations&#8221;, Topical Meeting of the Optical Fabrication &amp; Testing (OF&amp;T), Jackson Hole, WY, OThB5, June 2010 <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">W. Williams, B. Mullany, P.Moyer, W. Parker, M. Randles, &#8221; Evaluating Subsruface Damage with Quantum Dots&#8221;, Topical Meeting of the Optical Fabrication &amp; Testing (OF&amp;T), Jackson Hole, WY, OWA3, June 2010 <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">W. Williams, B. Mullany, P.Moyer, W. Parker, &#8220;Adding quantum dots to abrasive slurries to detect subsurface damage in polished glass&#8221;, Technical Digest, Optifab 2009, Rochester, TD06-34, May 2009 <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, E. Corcoran, &#8220;Frequency response of polishing pitch samples&#8221;, Technical Digest, Optifab 2009, Rochester, TD06-04, May 2009 <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, E Corcoran, &#8220;New Metrics for Polishing Pitch&#8221;, Topical Meeting of the Optical Fabrication &amp; Testing (OF&amp;T) Topical Meeting, Rochester, NY, Oct 2008. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, E Corcoran, &#8220;An Innovative Look at Precision Polishing Tools&#8221;, Proceedings of the 3rd CIRP International Conference on High Performance Cutting, Dublin, Ireland, June 12-13, ISBN 978-1-905254-32-3, pp 589-598, 2008. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, A. Landis, W. Williams, P. Murray, I. Roberts, Pitch polishing of silica &#8211; Correlation between material removal rates and obtainable surface finishes, Optifab 2007, CD 260, TD04-53, May 2007. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, E. Corcoran, Off the shelf PTFE as a fine polishing pad, Technical Digest, Optifab 2007, CD 260, TD04-51, May 2007. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">A. Bielke, K. Beckstette, C. K\u00fcbler, B. Mullany, M. Pollmann, H. Wang, Fabrication of Aspheric Optics Process Challenges arising from a wide range of Customer Demands and Diversity of Machine Technologies, SPIE proceedings, St Etiennes, France, Oct 2003.<\/span><\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Conference Proceedings based on Reviewed Abstract<\/strong><\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li>J. Redford, B. Mullany,&nbsp;&#8220;Systematic Selection of Texture Parameters for Optimal Surface Classification&#8221;, 23rd International Conference on Metrology and Properties of Surfaces, Glasgow, Scotland,&nbsp; (Met and Props 2022).<\/li>\n\n\n\n<li>J. Redford, A. Sood, J. Fox, R. Isaacs, C. Evans, E. Morse, B.Mullany, A. Allen,&nbsp;&#8220;<em>P<\/em>article Characterization on Laser Powder Bed Fusion Nickel Super Alloy 625 Surfaces&#8221;, 23rd International Conference on Metrology and Properties of Surfaces, Glasgow, Scotland, (Met and Props 2022).<\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">J.C. Fox, A. Allen, B. Mullany, E. Morse, R.A. Isaacs, M. Lata, A. Sood, and C. Evans, &#8220;Surface topography process signatures in nickel superalloy 625 additive manufacturing&#8221;, Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing Inspire AG, St. Gallen, Switzerland 2021.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">H. Shahinian, M. Hassan, H. Cherukuri, B. Mullany, Fiber Based Tools for Precision Polishing Applications, 32nd ASPE Annual Meeting, Charlotte, NC, October 2017.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">F. Azimi, B. Young, B. Mullany, Statistical Analysis of Surface Measurements and Images, 32nd ASPE Annual Meeting, Charlotte, NC, October 2017. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">H. Shahinian, and B. Mullany, Fiber Based Polishing Tools for Optical Applications, Optical Design and Fabrication (Freeform, IODC, OFT) OSA Technical Digest (online) (Optical Society of America, 2017), paper OTu2B.4, https:\/\/doi.org\/10.1364\/OFT.2017.OTu2B.4, July 2017.<\/span><\/li>\n<\/ul>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-family: georgia,palatino;font-size: small\">F. Azimi, E. Fleischhauer, P. Tkacik, R. Keanini ,B. Mullany, &#8220;Correlations Between Media-Workpiece Contact Modes Occurring During Vibrational Finishing and the Resulting Workpiece Topography&#8221;, 15th International Conference on Metrology and Properties of Engineering Surfaces, Charlotte, NC, March 2015.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">J. Hunt, S. Howard, B. Mullany, S.T. Smith, \u201cInvestigation of Tooling Effects, Slurry Composition and Workpiece Material in Vortex Machining\u201d, Proceedings of the 28th Annual Meeting of the American Society for Precision Engineering, November, St. Paul, Minnesota, 2013<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Stephen Howard, Brigid Mullany, Stuart Smith, Design and Implementation of a High-Power Machining Facility for Investigations in Vortex Machining, Proceedings of the 13th euspen International Conference, Berlin, May 2013.<\/span><\/li>\n\n\n\n<li><span style=\"font-size: small\"><span style=\"font-family: georgia,palatino\">S<\/span><span style=\"font-family: georgia,palatino\">. Howard, B. Mullany, S.T. Smith, \u201cPreliminary Characterization of Vortex Machining\u201d, to be published in the Proceedings of the 12<sup>th<\/sup> International Conference and 4<sup>th<\/sup> General Meeting of the European Society for Precision Engineering and Nanotechnology, 2012.<\/span><\/span><\/li>\n<\/ul>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Bowes, K. E. Dong, Y.; Mullany, B. A.; Morse, E. P.; Davies, A. D., \u201cForm Measurements of Specular Parts by Combining Beam Propagation, Optical Scattering, and Photogrammetry\u201d, Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, November, Denver, Colorado, 2011<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Dong, Y.; Hutchens, T.; Mullany, B. A.; Morse, E. P.; Davies, A. D., \u201cUsing an Optical Software Package to Analyze Photogrammetry System Errors\u201d, Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, November, Denver, Colorado, 2011<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Howard, S. C.; Chesna, J. W.; Mullany, B. A.; Smith, S. T., \u201cSubcomponent Developments for a Vortex Machining Test Facility\u201d, Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, November, Denver, Colorado, 2011.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Mainuddin, M.; Browy, E.; Mullany, B. A., \u201cDesign of a Test Platform to Investigate the Role of Process Vibrations in Precision Polishing\u201d , Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, November, Denver, Colorado, 2011.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Zheng, B.; Mullany, B. A.; Morse, E. P. ; Davies, A. D., \u201cPosition Sensoring Module by Combining Photogrammetry and Projection Pattern\u201d , Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, November, Denver, Colorado, 2011.<\/span><\/li>\n<\/ul>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-family: georgia,palatino;font-size: small\">K. Bowes, B. Mullany, E. Morse, A. Davies, A, &#8220;Surface Form Measurements Combining Beam Propagation, Optical Scattering, and Photogrammetry&#8221;, Extended abstract for the ASPE Spring Topical Meeting at UNC Charlotte, NC, March 2011. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">M. Mainuddin, B. Mullany, &#8220;Vibration Attentuation in Optical Pitch&#8221;, Extended Abstract for the ASPE Meeting in Oct, 2010. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">W. Williams, B. Mullany, P. Moyer, W. Parker, M. Randles, Testing Quantum Dots as a Means of Assessing Subsurface Damage in Polished Glass, Extended Abstract for the ASPE Meeting in Oct, 2009. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, S. Turner, E. Corcoran, Steady-State Dynamic Testing of Polishing Pitch, Extended Abstract for the ASPE Meeting in Oct, 2009. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">W. Williams, B. Mullany, P. Moyer, W. Parker, M. Randles,&nbsp; Characterizing Quantum Dots for Use in Detecting Subsurface Damage, Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, October 19-24, Portland, Oregon, Volume 44, p. 440, 2008. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, W. Williams, Real time measurement of Friction and Vibration during Polishing, ASPE Conference, October 2006. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, Pad-Wafer Interface Temperatures during Chemical Mechanical Polishing (CMP) of Oxide Coated Silicon Wafers, Proceedings of the 3rd International Conference and 4th General Meeting of the European Society for Precision Engineering and Nanotechnology, Vol. 1, pp. 261-264, 2002. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, M. Power, The Effect of Slurry Viscosity on CMP, 2000 Proceedings of the Seventeenth International VLSI Multi-level Interconnection Conference (VMIC), June 27-29, pp. 525-521, 2000 (invited paper). <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, M. Power, The Effect of Polishing Pad Geometry on CMP Planarisation Capabilities, Euspen Conference Proceedings Vol. 1, pp. 400-403, (ISBN 3-8265 6085-X), May 1999. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, M. Power, The Effect of Polishing Pad Conditioning on the Planarisation Capability of the Chemical Mechanical Polishing Process, Proceedings of the Chemical Mechanical Polishing (CMP) for ULSI Multi-scale Interconnection Conference, pp. 147-150 (Library of Congress No. 89-644090), Feb. 1999. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, P. Young, G. Byrne, FEM Analysis of Pad Conditions in the Chemical Mechanical Polishing of Silicon Wafers, Proceedings of the Fifteenth Conference of the Irish Manufacturing Committee, pp. 37-44, Sept 1998. <\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">B. Mullany, G. Byrne, P. Young, S. Galligan, Global Planarity of Silicon Wafers resulting from Chemical Mechanical Polishing, IMC-14 Proceedings of the Fourteenth Conference of the Irish Manufacturing Committee, pp. 451-459, Sept. 1997.<\/span><\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Other<\/strong><\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-family: georgia,palatino;font-size: small\">Dahlberg, J., Tkacik, P. T., Mullany, B., Fleischhauer, E., Shahinian, H., Azimi, F., et al. An Analog Macroscopic Technique for Studying Molecular Hydrodynamic Processes in Dense Gases and Liquids. J. Vis. Exp. (130), e56632, doi:10.3791\/56632 (2017).<\/span><\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Patents<\/strong><\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-family: georgia,palatino;font-size: small\">U.S. Patent Application 10,562,146, &#8220;Fiber Based Finishing Tools&#8221;, B. Mullany, H. Shahinian, Feb. 2020.<\/span><\/li>\n\n\n\n<li><span style=\"font-family: georgia,palatino;font-size: small\">U.S. Patent Application No. 13\/188,969, \u201cDimensional Measurement Through a Combination of Photogrammetry and Optical Scattering\u201d, A. Davies, B. Mullany, E. Morse, M. Davies, 2011.<\/span><\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Papers in Referred Journals Reviewed Conference Proceedings Conference Proceedings based on Reviewed Abstract Other Patents<\/p>\n","protected":false},"author":65,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-19","page","type-page","status-publish","hentry"],"jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/pages\/19","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/users\/65"}],"replies":[{"embeddable":true,"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/comments?post=19"}],"version-history":[{"count":5,"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/pages\/19\/revisions"}],"predecessor-version":[{"id":1183,"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/pages\/19\/revisions\/1183"}],"wp:attachment":[{"href":"https:\/\/coefs.charlotte.edu\/bamullan\/wp-json\/wp\/v2\/media?parent=19"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}